Journal
APPLIED PHYSICS LETTERS
Volume 95, Issue 26, Pages -Publisher
AMER INST PHYSICS
DOI: 10.1063/1.3276693
Keywords
carrier mobility; defect states; effective mass; organic field effect transistors; organic semiconductors; permittivity; semiconductor-insulator boundaries
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Funding
- Swiss National Science Foundation [200020-113254]
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The charge carrier mobility in the transport channel of an organic transistor is estimated within the framework of a trap-and-release model. The model accounts for the observed dependence of the mobility on the dielectric constant epsilon of the gate insulator. This dependence is attributed to both the effective mass of the carrier and the energetic depth of transport traps due to interface defects being functions of epsilon. These results are used to describe the critical role of the interface between the organic semiconductor and the dielectric material in governing charge transport in organic transistors.
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