Journal
APPLIED PHYSICS LETTERS
Volume 94, Issue 4, Pages -Publisher
AMER INST PHYSICS
DOI: 10.1063/1.3076124
Keywords
hole density; hole mobility; organic compounds; organic field effect transistors; semiconductor device models; thin film transistors
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Funding
- MEXT, Japan [18340104]
- Grants-in-Aid for Scientific Research [18340104] Funding Source: KAKEN
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Transport characteristics and trap states are investigated in picene thin film field-effect transistor under O-2 atmosphere on the basis of multiple shallow trap and release (MTR) model. The channel transport is dominated by MTR below 300 K. It has been clarified on the basis of MTR model that the O-2-exposure induces a drastic reduction in shallow trap density to increase both the field-effect mobility mu and on-off ratio. We also found that the O-2-exposure never caused an increase in hole carrier density. Actually, a very high mu value of 3.2 cm(2) V-1 s(-1) is realized under 500 Torr of O-2.
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