Journal
APPLIED PHYSICS LETTERS
Volume 95, Issue 7, Pages -Publisher
AMER INST PHYSICS
DOI: 10.1063/1.3206954
Keywords
energy gap; II-VI semiconductors; permittivity; refractive index; semiconductor thin films; surface plasmon resonance; temperature sensors; wide band gap semiconductors; zinc compounds
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Funding
- DST
- DRDO
- UGC
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Temperature dependent optical properties of c-axis oriented ZnO thin film were investigated using surface plasmon resonance (SPR) technique. SPR data for double layer (prism-Au-ZnO-air) and single layer (prism-Au-air) systems were taken over a temperature range (300-525 K). Dielectric constant at optical frequency and real part of refractive index of the ZnO film shows an increase with temperature. The bandgap of the oriented ZnO film was found to decrease with rise in temperature. The work indicates a promising application of the system as a temperature sensor and highlights an efficient scientific tool to study optical properties of thin film under varying ambient conditions.
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