Journal
APPLIED PHYSICS LETTERS
Volume 95, Issue 17, Pages -Publisher
AMER INST PHYSICS
DOI: 10.1063/1.3241075
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Funding
- National Science Foundation [NSF-CMMI 0926819, NSF-DMR 0820884]
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We report here, an investigation on electrical and structural-microstructural properties of an individual ZnO nanobelt via in situ transmission electron microscopy using an atomic force microscopy (AFM) system. The I-V characteristics of the ZnO nanobelt, just in contact with the AFM tip indicates the insulating behavior, however, it behaves like a semiconductor under applied stress. Analysis of the high resolution lattice images and the corresponding electron diffraction patterns shows that each ZnO nanobelt is a single crystalline, having wurtzite hexagonal structure (a = 0.324 nm, c = 0.520 66 nm) with a general growth direction of [10 (1) over bar0]. (C) 2009 American Institute of Physics. [doi:10.1063/1.3241075]
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