Journal
APPLIED PHYSICS LETTERS
Volume 93, Issue 6, Pages -Publisher
AMER INST PHYSICS
DOI: 10.1063/1.2971035
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Funding
- U. S. Department of Energy, Office of Science [DE-AC02-06CH11357]
- DOD-ARO [0402-17291, W911NF-05-10353]
- NSF [DMR-0747808]
- Direct For Mathematical & Physical Scien
- Division Of Materials Research [747808] Funding Source: National Science Foundation
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By using an alternative wet-etch procedure, we have obtained high-quality atomically flat TiO(2) terminated surfaces of SrTiO(3) single crystals with the morphology equivalent to that of the conventional wet-etch methods. By applying a combined power of photoluminescence (PL) spectroscopy, reflection high-energy electron diffraction, atomic force microscopy imaging, and soft x-ray absorption (XAS), we were able to identify and monitor the complex evolution of oxygen defect states and Ti valency at the surface and near-surface layers. Our experiments revealed a high level of local defects resulting in the presence of the Ti(3+) states at the surface. We have developed a method to control the defect states capable of a marked reduction of the defect concentration. We have demonstrated that the PL and XAS are able to distinguish the surface-related Ti(3+) states from oxygen vacancies trapping charge transfer vibronic excitons that define the PL intensity. The experimental findings will have important implications for the growth of high-quality ultrathin complex oxide heterostructures. (C) 2008 American Institute of Physics.
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