Journal
APPLIED PHYSICS LETTERS
Volume 93, Issue 19, Pages -Publisher
AMER INST PHYSICS
DOI: 10.1063/1.3030979
Keywords
band structure; charge injection; MIS structures; organic semiconductors; Schottky barriers; semiconductor-metal boundaries
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Funding
- Ontario Centres of Excellence
- Natural Sciences and Engineering Research Council (NSERC) of Canada
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Charge injection at metal/organic interfaces dictates the performance, lifetime, and stability of organic electronic devices. We demonstrate that interface dipole theory, originally developed to describe Schottky contacts at metal/semiconductor interfaces, can also accurately describe the injection barriers in real organic electronic devices. It is found that theoretically predicted hole injection barriers for various archetype metal/organic and metal/oxide/organic structures are in excellent agreement with values extracted from experimental transport measurements. Injection barriers at metal/organic and metal/oxide/organic interfaces can therefore be accurately predicted based on the knowledge of only a few fundamental material properties of the oxide and organic layers.
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