Noise measurement of a quantized charge PUMP

We study the noise properties of a gate controlled single electron pump at a driving frequency f(p) =400 MHz. We observe a significant reduction of the noise power on the current plateaus. This is a strong indication for true quantized charge pumping. We furthermore observe a small level of low frequency fluctuations which-indicates a good frequency stability of the pump. (C) 2008 American Institute of Physics.