Focusing of hard x-rays to 16 nanometers with a multilayer Laue lens

We report improved results for hard x-ray focusing using a multilayer Laue lens (MLL). We have measured a line focus of 16 nm width with an efficiency of 31% at a wavelength lambda=0.064 nm (19.5 keV) using a partial MLL structure with an outermost zone width of 5 nm. The results are in good agreement with the theoretically predicted performance. (C) 2008 American Institute of Physics.