Journal
APPLIED PHYSICS LETTERS
Volume 93, Issue 22, Pages -Publisher
AMER INST PHYSICS
DOI: 10.1063/1.3043426
Keywords
carbon; contact resistance; nanostructured materials; quantum Hall effect
Categories
Funding
- Stichting Fundamenteel Onderzoek der Materie (FOM)
- Nederlandse Organisatie voor Wetenschappelijk Onderzoek (NWO)
Ask authors/readers for more resources
We performed a metrological characterization of the quantum Hall resistance in a 1 mu m wide graphene Hall bar. The longitudinal resistivity in the center of the nu=+/- 2 quantum Hall plateaus vanishes within the measurement noise of 20 m Omega up to 2 mu A. Our results show that the quantization of these plateaus is within the experimental uncertainty (15 ppm for 1.5 mu A current) equal to that in conventional semiconductors. The principal limitation of the present experiments is the relatively high contact resistances in the quantum Hall regime, leading to a significantly increased noise across the voltage contacts and a heating of the sample when a high current is applied.
Authors
I am an author on this paper
Click your name to claim this paper and add it to your profile.
Reviews
Recommended
No Data Available