Journal
APPLIED PHYSICS LETTERS
Volume 92, Issue 10, Pages -Publisher
AMER INST PHYSICS
DOI: 10.1063/1.2897238
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- Engineering and Physical Sciences Research Council [GR/S97040/01] Funding Source: researchfish
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Low frequency admittance measurements are used to determine the density of interface states in metal-insulator-semiconductor diodes based on the unintentionally doped, p-type semiconductor poly(3-hexylthiophene). After vacuum annealing at 90 degrees C, interface hole trapping states are shown to be distributed in energy with their density decreasing approximately linearly from similar to 20x10(10) to 5x10(10) cm(-2) eV(-1) over an energy range extending from 0.05 to 0.25 eV above the bulk Fermi level. (c) 2008 American Institute of Physics.
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