Related references
Note: Only part of the references are listed.Modeling and characterization of a cantilever-based near-field scanning microwave impedance microscope
K. Lai et al.
REVIEW OF SCIENTIFIC INSTRUMENTS (2008)
Near-field microwave microscope measurements to characterize bulk material properties
Atif Imtiaz et al.
APPLIED PHYSICS LETTERS (2007)
Atomic-force-microscope-compatible near-field scanning microwave microscope with separated excitation and sensing probes
K. Lai et al.
REVIEW OF SCIENTIFIC INSTRUMENTS (2007)
Design and fabrication of scanning near-field microwave probes compatible with atomic force microscopy to image embedded nanostructures
M Tabib-Azar et al.
IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES (2004)
Near-field microwave microscope with improved sensitivity and spatial resolution
A Tselev et al.
REVIEW OF SCIENTIFIC INSTRUMENTS (2003)
A novel STM-assisted microwave microscope with capacitance and loss imaging capability
A Imtiaz et al.
ULTRAMICROSCOPY (2003)
Microfabricated silicon coaxial field sensors for near-field scanning optical and microwave microscopy
BT Rosner et al.
SENSORS AND ACTUATORS A-PHYSICAL (2002)
Evanescent microwave probe measurement of low-k dielectric films
ZY Wang et al.
JOURNAL OF APPLIED PHYSICS (2002)
High-frequency near-field microscopy
BT Rosner et al.
REVIEW OF SCIENTIFIC INSTRUMENTS (2002)
Improved surface imaging with a near-field scanning microwave microscope using a tunable resonator
S Hong et al.
APPLIED PHYSICS LETTERS (2002)
Share Paper
