Journal
APPLIED PHYSICS LETTERS
Volume 93, Issue 11, Pages -Publisher
AMER INST PHYSICS
DOI: 10.1063/1.2980031
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Funding
- Center for Nanoscale Materials Sciences
- Division of Materials Sciences and Engineering
- Eugene P. Wigner Fellowship
- Office of Basic Energy Sciences
- U. S. Department of Energy [DE-AC05-00OR22725]
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A rapid multidimensional spectroscopic imaging approach in scanning probe microscopy is developed and applied to piezoresponse force spectroscopy. Evolution of resonance frequency, dissipation, and piezoresponse signal at each point during acquisition of local hysteresis loops provides information on polarization dynamics and voltage dependent contact mechanics of ferroelectric surfaces. The measurements illustrate significant frequency shifts during piezoresponse force spectroscopy, necessitating the use of frequency-tracking methods. The method is universal and can be extended to other scanning probe microscopy techniques. (C) 2008 American Institute of Physics.
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