Journal
APPLIED PHYSICS LETTERS
Volume 92, Issue 8, Pages -Publisher
AMER INST PHYSICS
DOI: 10.1063/1.2870100
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The authors have studied the substrate-induced strain effect in La0.875Ba0.125MnO3 (LBMO) thin films grown on ferroelectric 0.67Pb(Mg1/3Nb2/3)O-3-0.33PbTiO(3) (PMN-PT) single-crystal substrates. Both the strain and resistance of the films can be in situ varied by applying an electric field across the PMN-PT substrates. X-ray diffraction analysis indicates that the variations of strain and resistance result from the induced strain in the PMN-PT substrate due to the ferroelectric polarization or the converse piezoelectric effect. The relationships between the resistance and the induced strain in the LBMO film and PMN-PT substrate have been quantitatively analyzed. (c) 2008 American Institute of Physics.
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