Spatial distribution of crown shaped light emission from a periodic inverted polygonal deflector embedded in an InGaN/GaN light emitting diode

We investigated spatial light emission from a periodic inverted polygonal deflector, which included six {10-1-1} facets and six {11-2-2} facets embedded in an InGaN/GaN light emitting diode by using confocal scanning electroluminescence microscopy. We found a noticeable crown shape with the contrast of luminescence intensity and wavelength observed on these facets mainly due to the variation of growth rate for the InGaN quantum wells. In addition, a very low intensity and blueshifted emission wavelength on the {11-2-2} facets indicated the deficiency of indium incorporation and/or much thinner well thickness as compared to that of the {10-1-1} facets. (c) 2008 American Institute of Physics.