Journal
APPLIED PHYSICS LETTERS
Volume 92, Issue 18, Pages -Publisher
AMER INST PHYSICS
DOI: 10.1063/1.2917798
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We report on multilayer x-ray reflectivity measurements of the Si-Ge interdiffusivity in epitaxial SixGe1-x/SiyGe1-y superlattices that have an average Ge composition of 91 at. %. The extracted activation enthalpy (3.20 +/- 0.2 eV) is substantially smaller than that previously reported for Si-rich SiGe alloys and the interdiffusivity value at typical dopant anneal temperatures is, therefore, much larger for the Ge-rich heterostructures. The activation enthalpy for interdiffusion measured for the < X-Ge >=0.91 superlattice is reasonably consistent with a linear interpolation between the recently reported value for an alloy with < X-Ge >approximate to 0.5 and that reported for self-diffusion in pure Ge. (C) 2008 American Institute of Physics.
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