Journal
APPLIED PHYSICS LETTERS
Volume 93, Issue 18, Pages -Publisher
AMER INST PHYSICS
DOI: 10.1063/1.3012378
Keywords
dielectric materials; electrodes; grain boundaries; lead compounds; multiferroics; permittivity; solid-state phase transformations; X-ray diffraction
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Funding
- AICTE
- CSIR
- Korean Ministry of Science and Technology (MOST)
- POSTECH, Pohang, Korea
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Frequency dependent dielectric studies on the mixed system (1-x)Pb(Fe1/2Nb1/2)O-3-xPbTiO(3) reveal contributions from the electrodes, grain boundaries, and grains. It is shown that the intrinsic value of the dielectric permittivity coming only from the grains peaks at x=0.08. Analysis of synchrotron x-ray diffraction profiles using the Rietveld technique shows that this peaking is linked with a monoclinic to tetragonal morphotropic phase transition in the multiferroic system.
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