High-speed x-ray reflectometory in multiwavelength-dispersive mode

The potential of a high speed x-ray reflectometer for time-resolved studies on the subsecond to millisecond timescales is demonstrated by recording x-ray reflection curves from a small area (1 mmx10 mm) of a 14.3 nm thick gold film on a silicon substrate with data collection times of 0.05-1 s. A horizontally convergent x-ray beam having a one-to-one correlation between ray direction and energy is produced by a curved crystal polychromator, and the beam is incident on and vertically reflected by a specimen placed at the focus. The x-ray reflectivity is measured as a function of the x-ray energy downstream of the focus using a one dimensional detector with no need for angle scan of the specimen and detector. (c) 2008 American Institute of Physics.