Journal
PHYSICAL REVIEW LETTERS
Volume 94, Issue 1, Pages -Publisher
AMER PHYSICAL SOC
DOI: 10.1103/PhysRevLett.94.017002
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The low-frequency dielectric response of hole-doped insulators La2Cu1-xLixO4 and La2-xSrxNiO4 shows a large dielectric constant epsilon(') at high temperature and a steplike drop by a factor of 100 at a material-dependent low temperature T-f. T-f increases with frequency, and the dielectric response shows universal scaling in a Cole-Cole plot, suggesting that a charge-glass state is realized both in the cuprates and in the nickelates.
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