4.7 Article

Characterization of electrical properties and photosensitivity of SnS thin films prepared by the electrochemical deposition method

Journal

SOLAR ENERGY MATERIALS AND SOLAR CELLS
Volume 85, Issue 2, Pages 153-165

Publisher

ELSEVIER
DOI: 10.1016/j.solmat.2004.04.014

Keywords

electrochemical deposition; tin sulfide; pulse-form biasing; resistivity; photoelectrochemical measurements

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Using the electrochemical deposition (ECD) method, we prepared tin sulfide thin films, which are suitable for the absorption layer in solar cells because of its bandgap energy (similar to 1 eV). We first optimized pulse-form biasing for ECD by characterizing deposited samples with scanning electron microscope, Auger electron spectroscopy and X-ray diffraction measurements. Then, we investigated the electrical properties of deposited SnS thin films and the properties of contacts with several different metals. Furthermore, we observed the photoconductivity of the films by means of photoelectrochernical measurements. From these results. we confirmed that the SnS thin films show p-type conduction. (C) 2004 Elsevier B.V. All rights reserved.

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