Journal
APPLIED PHYSICS LETTERS
Volume 86, Issue 5, Pages -Publisher
AMER INST PHYSICS
DOI: 10.1063/1.1857081
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We report on a method to locally remove material from carbon and boron nitride nanotubes using the low-energy focused electron beam of a scanning electron microscope. Using this method, clean precise cuts can be made into nanotubes, either part-way through (creating hingelike geometries) or fully through (creating size-selected nanotube segments). This cutting mechanism involves foreign molecular species and differs from electron-beam-induced knock-on damage in transmission electron microscopy. (C) 2005 American Institute of Physics.
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