Site-Specific Fragmentation of Polystyrene Molecule Using Size-Selected Ar Gas Cluster Ion Beam

The secondary ion mass spectrum (SIMS) of a polystyrene thin film was investigated using a size-selected Ar gas cluster ion beam (GCIB). The fragmentation in the SIM spectrum varied by kinetic energy per atom (E(atom)); the E(atom) dependence of the secondary ion intensity of the fragment species of polystyrene can be essentially classified into three types based on the relationship between E(atom) and the dissociation energy of a specific bonding site in the molecule. These results indicate that adjusting E(atom) of size-selected GCIB may realize site-specific bond breaking within a molecule. (C) 2009 The Japan Society of Applied Physics