Two-dimensional thermographic phosphor thermometry using a CMOS high speed camera system

In the present study, a CMOS high speed camera system was employed for two-dimensional thermographic phosphor thermometry. By the pixelwise evaluation of the luminescence lifetimes, a temperature map of a phosphor layer can be obtained. Using spatially and temporally isothermal conditions in a tube furnace, a temperature lifetime characteristic was determined for the phosphor Mg4FGeO6: Mn and was compared with data obtained by point measurements using a photomultiplier tube. Both, the pixel-to-pixel and the shot-to-shot standard deviation were evaluated at different temperatures. Non-linearities and pixel-to-pixel inhomogeneities of the CMOS chip were characterised and corrected employing a homogeneous light source.