Journal
REVIEW OF SCIENTIFIC INSTRUMENTS
Volume 76, Issue 2, Pages -Publisher
AMER INST PHYSICS
DOI: 10.1063/1.1834702
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Spectral generalized magneto-optical ellipsometry is presented as an optical tool for the simultaneous measurement of the complex index of refraction n=n+ik, the complex magneto-optical coupling parameter Q=Q(r)+iQ(i) (i.e., the Voigt-parameter), and the orientation of the saturation magnetization M-s of isotropic ferromagnetic bulk materials. For wavelengths between 220 nm and 790 nm and at temperatures between 4.2 K and 800 K measurements on iron and permalloy demonstrate the comfortable application of this technique in order to resolve the spectral response of spin-polarized carriers and bands, which can provide valuable insight about the formation of the ferromagnetic state. (C) 2005 American Institute of Physics.
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