Journal
SURFACE SCIENCE
Volume 576, Issue 1-3, Pages L57-L64Publisher
ELSEVIER
DOI: 10.1016/j.susc.2004.12.020
Keywords
aluminum; nickel; aluminum oxide; thin film; coincidence lattice; STM; SPA-LEED
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Spot profile analysis low energy electron diffraction (SPA-LEED) and low temperature scanning tunneling microscopy (LT-STM) measurements were performed on an ultra thin alumina film grown at 1000 K in an oxygen atmosphere on Ni3Al(111). By the aid of these two experimental techniques it has been shown that the alumina film exhibits a large superstructure with a lattice constant of 4.16 nm. The unit cell of this superstructure has a commensurate (root67 x root67)R47.784degrees relation to the Ni3Al(1 1 1) substrate lattice. (C) 2005 Elsevier B.V. All rights reserved.
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