4.4 Article

On the optical properties of bismuth oxide thin films prepared by pulsed laser deposition

Journal

THIN SOLID FILMS
Volume 473, Issue 2, Pages 230-235

Publisher

ELSEVIER SCIENCE SA
DOI: 10.1016/j.tsf.2004.07.061

Keywords

bismuth oxide; ellipsometry; optical properties; reflection spectra

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The optical properties of bismuth oxide films prepared by pulsed laser deposition (PLD), absorption in the photon energy range 2.50-4.30 eV and optical functions (n, k, epsilon(1), and epsilon(2)) in the domain 3.20-6.50 eV, have been investigated. As-prepared films (d = 0.05-1.50 mum) are characterized by a mixture of polycrystalline and amorphous phases. The fundamental absorption edge is described by direct optical band-to-band transitions with energies 2.90 and 3.83 eV The dispersion of the optical functions provided values of 4.40-6.25 eV for electron energies of respective direct transitions. In the spectral range 400-1000 nm, bismuth oxide films show a normal dispersion, which can be interpreted in the frame of a single oscillator model. (C) 2004 Elsevier B.V. All rights reserved.

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