Journal
APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING
Volume 97, Issue 3, Pages 721-724Publisher
SPRINGER HEIDELBERG
DOI: 10.1007/s00339-009-5306-z
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Funding
- Office of Naval Research [N0001407-0008]
- University of Missouri Research Board (UMRB)
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We report the fabrication of surface enhanced Raman spectroscopy (SERS) fused silica glass substrates using fast femtosecond-laser (fs-laser) scan, followed by silver chemical plating. A cross-section enhancement factor (EF) of 2.5x10(6), evaluated by Rhodamine 6G (10(-7) M solution), was obtained. The Raman mapping indicated a good uniformity over the fs-laser scanned area. The dimension and pattern of the SERS activated region can be conveniently controlled by laser 2D scanning, potentially enabling integration of SERS into a high-order optical-chemical analysis system on a glass chip.
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