Journal
PHYSICA B-CONDENSED MATTER
Volume 357, Issue 1-2, Pages 148-151Publisher
ELSEVIER
DOI: 10.1016/j.physb.2004.11.045
Keywords
thin film defects; GISAXS; polymer surfaces
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Micro-cracks induced by evaporation-assisted flow of a polymeric blend solution are investigated. After evaporation of the solvent toluene the blend film of polystyrene and poly-n-buthylacrylate exhibits small cracks aligned perpendicular to the original flow direction. The local defect in the elsewhere rather continuous blend film is probed with atomic force microscopy. With scanning sub-microbeam grazing incidence small angle X-ray scattering a position sensitive surface scattering experiment is presented. Due to the beam diameter of 0.9 mum the local micrometer sized defect structure is resolved. (C) 2004 Elsevier B.V. All rights reserved.
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