Journal
APPLIED SURFACE SCIENCE
Volume 241, Issue 1-2, Pages 131-134Publisher
ELSEVIER
DOI: 10.1016/j.apsusc.2004.09.086
Keywords
XPEEM; Wien filter; multipole; aberration correction
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We discussed a new design of a Wien filter energy analyzer for an energy-filtered X-ray photoemission electron microscopy system. We have demonstrated that the second-order aberration and the third-order aperture aberration can be corrected by the multipole Wien filter by adjusting multipole components of electric and magnetic fields up to octupole components. The three-dimensional charge simulation method indicated that 12 electrodes and magnetic poles can effectively reproduce these ideal electric and magnetic fields. (C) 2004 Elsevier B.V. All rights reserved.
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