Journal
NANO LETTERS
Volume 5, Issue 3, Pages 507-510Publisher
AMER CHEMICAL SOC
DOI: 10.1021/nl050053k
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The realization of high-performance electrical devices incorporating single-wall carbon nanotubes critically depends on the minimization of charge transport barriers in the tubes and at the contacts. Herein we demonstrate photocurrent imaging as a fast and effective tool to locate such barriers within individual metallic nanotubes; contacted by metal electrodes. The locally induced photocurrents directly reflect the existence of built-in electric fields associated with the presence of depletion layers at the contacts or structural defects along the tubes.
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