4.4 Article Proceedings Paper

The effect of RF power on tribological properties of the diamond-like carbon films

Journal

THIN SOLID FILMS
Volume 475, Issue 1-2, Pages 287-290

Publisher

ELSEVIER SCIENCE SA
DOI: 10.1016/j.tsf.2004.07.033

Keywords

atomic force microscopy; diamond-like carbon; friction force microscopy; surface roughness; tribology

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DLC thin films were prepared by radio frequency (RF) plasma-enhanced chemical vapor deposition (PECVD) method on silicon substrates using methane (CH4), hydrogen (H-2) and gas mixture. We have checked the influence of varying RF power on DLC film. The Raman spectroscopy shows the diamond-like carbon (DLC) amorphous structure of the films. AFM images show the surface roughness of the DLC film decrease with increasing RF power. Also, the friction coefficients were investigated by atomic force microscope (AFM) in triction force microscope (FFM) mode. (C) 2004 Elsevier B.V. All rights reserved.

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