Journal
CELLULOSE
Volume 12, Issue 2, Pages 127-134Publisher
SPRINGER
DOI: 10.1007/s10570-004-1574-0
Keywords
Atomic force microscopy; Carboxymethylcellulose; Cellulose; Nanocrystals; Poly(diallyl-dimethyl-ammonium chloride); Silicon; Surface properties
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Thin layers of cellulose I nanocrystals were spin-coated onto silicon wafers to give a. at model cellulose surface. A mild heat treatment was required to stabilize the cellulose layer. Interactions of this surface with polyelectrolyte layers and multilayers were probed by atomic force microscopy in water and dilute salt solutions. Deflection-distance curves for standard silicon nitride tips were measured for silicon, cellulose-coated silicon, and for polyelectrolytes adsorbed on the cellulose surface. Transfer of polymer to the tip was checked by running deflection - distance curves against clean silicon. Deflection-distance curves were relatively insensitive to adsorbed polyelectrolyte, but salt addition caused transfer of cationic polyelectrolyte to the tip, and swelling of the polyelectrolyte multilayers.
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