Journal
IEEE PHOTONICS TECHNOLOGY LETTERS
Volume 17, Issue 4, Pages 744-746Publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/LPT.2004.842794
Keywords
curve fitting; intrinsic response; laser diode; parasitic network; S-parameters
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We describe a new method for extracting the intrinsic response of a laser diode from S-parameters measured using a calibrated vector network analyzer. The experimental results obtained using the new method are compared with those obtained using the optical modulation method and the frequency response subtraction method. Good agreement has been obtained, confirming the new method validity and accuracy. The new method has the advantages of obtaining the intrinsic characteristics of a laser diode with conventional measurements using a network analyzer.
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