Journal
SURFACE SCIENCE
Volume 581, Issue 2-3, Pages L115-L121Publisher
ELSEVIER
DOI: 10.1016/j.susc.2005.02.039
Keywords
high-resolution electron energy loss spectroscopy (HREELS); scanning tunneling microscopy (STM); X-ray photoelectron spectroscopy (XPS); titanium oxide; surface structure, morphology, roughness, and topography; thin film
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Well-ordered Mo(112)-(8 x 2)-TiOx films were grown on the Mo(112) surface. Two preparation methods, direct growth on the Mo(112) surface and indirect growth by deposition of Ti onto monolayer SiO2/MO(112), were used. The latter method was found to be more reproducible with respect to film quality as determined by low-energy electron diffraction and scanning tunneling microscopy. The well-ordered (8 x 2)-TiOx film, for which a structure is proposed, was determined to be 1 ML and the Ti to be in an oxidation state of +3 using Auger spectroscopy, high-resolution electron energy loss spectroscopy and X-ray photoelectron spectroscopy. (c) 2005 Published by Elsevier B.V.
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