Journal
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS
Volume 233, Issue -, Pages 235-239Publisher
ELSEVIER SCIENCE BV
DOI: 10.1016/j.nimb.2005.03.113
Keywords
ion atom collision; multiple inner shell ionization; high-resolution X-ray spectroscopy
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The double Is ionization of Si induced in collisions with protons and heavier ions (C, Ne) was studied by measuring the K X-ray emission of a solid Si target. In order to resolve the hypersatellite contributions in the spectra, high-resolution crystal diffractometry was employed yielding subelectronvolt energy resolution. Experimentally obtained hypersatellite yields were used to determine the double to single K shell ionization cross-section ratios sigma(KK)/sigma(K) corresponding to the investigated collisions. The experimental ratios for collisions with heavy ions, where direct Coulomb ionization and electron capture need both to be considered, were compared to the theoretical values calculated within the independent electron approximation employing single electron ionization probabilities calculated by the three body classical trajectory Monte-Carlo (CTMC) method. For proton collisions where direct ionization solely contributes to Is ionization the semiclassical approximation (SCA) was employed.
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