Journal
SURFACE AND INTERFACE ANALYSIS
Volume 37, Issue 5, Pages 524-526Publisher
JOHN WILEY & SONS LTD
DOI: 10.1002/sia.2034
Keywords
XPS; X-ray photoelectron spectroscopy; specimen charging; charge referencing; charge compensation; ISO; International Organization for Standardization
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International Standard ISO 19318 specifies the minimum amount of information describing the methods of charge control and charge correction in measurements of core-level binding energies for insulating specimens by x-ray photoelectron spectroscopy, which is to be reported with the analytical results. Information is also provided on methods that have been found useful for charge control and charge correction in the measurement of binding energies. Copyright © 2005 John Wiley & Sons, Ltd.
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