Magnetoresistive random access memory operation error by thermally activated reversal (invited)

The reliability in magnetoresistive random access memory (MRAM) write operation was investigated for both toggle and asteroid memory chips developed with 0.18 mu m CMOS process. Thermally activated magnetization reversal, being the dominant origin of the intrinsic write error, was studied theoretically and experimentally. For asteroid MRAM, the bit line or word line disturbing error on half selected bits was proved to have significant effect on the write operation margin, even in the ideal case free from bit-to-bit switching field distribution and the hysteresis loop shift. For toggle MRAM, on the other hand, the dominant origin of the error occurs for selected bits, although its impact is much smaller than in the case of asteroid MRAM. As was expected from the estimation based on the single domain model, more than 10 mA operation margin with the error rate of < 10(-9), which is sufficiently small for semiconductor IC memory, was achieved for the toggle MRAM. (c) 2005 American Institute of Physics.