Journal
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA
Volume 144, Issue -, Pages 1001-1004Publisher
ELSEVIER SCIENCE BV
DOI: 10.1016/j.elspec.2005.01.022
Keywords
angle resolved photoelectron spectroscopy; ARUPS; band structure; x-ray photoelectron diffraction; SiC (0001); Cu (111); graphite; Kikutchi; Bragg
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A second generation toroidal electron spectrometer is briefly described and results presented that demonstrate its capabilities. Band structure measurements obtained from graphitised SiC (0 0 0 1) and X-ray photoelectron diffraction results from Cu (1 1 1) and graphite are presented. (c) 2005 Elsevier B.V. All rights reserved.
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