NanoESCA:: Imaging UPS and XPS with high energy resolution

A novel imaging electron spectrometer has been used for laterally resolved ultraviolet photoelectron spectroscopy (UPS) and X-ray photoelectron spectroscopy (XPS) in the soft X-ray range. The instrument is based on a high-resolution emission microscope optics using a cathode lens and an imaging dispersive analyser. The analyser is corrected for the leading aberration term (alpha(2)-term) by means of two hemispherical analysers in antisymmetric configuration with an appropriate transfer lens. Small-area spectra as well as energy-filtered images have been taken in the soft X-ray range for a meteorite sample and in the range of the d-band of a Cu polycrystal. An energy resolution of 106 meV along with a high spatial resolution allows a detailed analysis of trace elements in the meteorite sample as well as local UPS spectra of the surface of the Cu sample. (c) 2005 Elsevier B.V. All rights reserved.