Journal
IEEE TRANSACTIONS ON RELIABILITY
Volume 54, Issue 2, Pages 297-303Publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/TR.2005.847278
Keywords
degradation processes; degraded system reliability; multiple-failure processes; multi-state reliability; random shocks
Ask authors/readers for more resources
In this paper, we develop a generalized multi-state degraded system reliability model subject to multiple competing failure processes, including two degradation processes, and random shocks. The operating condition of the multi-state systems is characterized by a finite number of states. We also present a methodology to generate the system states when there are multi-failure processes. The model can be used not only to determine the reliability of the degraded systems in the context of multi-state functions, but also to obtain the states of the systems by calculating the system state probabilities. Several numerical examples are given to illustrate the concepts.
Authors
I am an author on this paper
Click your name to claim this paper and add it to your profile.
Reviews
Recommended
No Data Available