4.5 Article

AC conductivity and dielectric behavior of high-temperature form of copper silver phosphate

Journal

IONICS
Volume 21, Issue 7, Pages 1973-1982

Publisher

SPRINGER HEIDELBERG
DOI: 10.1007/s11581-014-1362-2

Keywords

X-ray diffraction; Raman spectroscopy; Equivalent circuit; AC conductivity

Funding

  1. Ministry of Higher Education, Scientific Research, Information and Communication Technologies of Tunisia

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The high-temperature form of AgCuPO4 (i. e., beta-AgCuPO4) was obtained by conventional solid-state reaction. The sample was characterized by X-ray powder diffraction, Raman, and electrical impedance spectroscopy. Electrical properties were investigated using impedance measurements in the frequency range from 209 Hz to 1 MHz and the temperature range 603 to 719 K. Z' and Z versus frequency plots were well fitted to an equivalent circuit model. It was found that the data of the ac measurements follow the correlated barrier hopping (CBH) model and the model's parameters were determined.

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