Journal
SEMICONDUCTOR SCIENCE AND TECHNOLOGY
Volume 20, Issue 7, Pages S293-S299Publisher
IOP PUBLISHING LTD
DOI: 10.1088/0268-1242/20/7/021
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We report an evaluation of pulsed terahertz (THz) time-domain measurement and continuous wave (CW) terahertz measurement for non-destructive testing applications. The strengths and limitations of the modalities are explored via the example of the detection of defects in space shuttle foam insulation. It is decided that CW imaging allows for a more compact and simple system, while pulsed measurements yield a broader range of information.
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