Journal
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS
Volume 236, Issue -, Pages 377-382Publisher
ELSEVIER SCIENCE BV
DOI: 10.1016/j.nimb.2005.03.280
Keywords
polytetrafluoroethylene; PTFE; degradation; electron spectroscopy; synchrotron radiation; mass analysis
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The VUV-photodegradation of polytetrafluoroethylene (PTFE) ultra-thin film was studied by ultraviolet photoelectron spectroscopy and quadrupole mass spectrometry. These results were compared with the previous photodegradation studies of the polyvinylidenefluoride (PVDF) and polyethylene (PE). Generation of new peak, pi-band originated from the C=C bond, was observed in the low binding energy region of the UPS spectra in both PVDF and PE during the photo degradation. In contrast, no new peak generation was observed in the UPS of the photodegraded PTFE. Mass spectrometry analysis also suggested that the C=C bond generation is not a major mechanism in the VUV photodegradation of PTFE. (c) 2005 Elsevier B.V. All rights reserved.
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