Sample handler for x-ray tomographic microscopy and image-guided failure assessment -: art. no. 076106

X-ray tomographic microscopy (XTM) yields a three-dimensional data model of an investigated specimen. XTM providing micrometer resolution requires synchrotron light, high resolution area detectors, and a precise sample handler. The sample handler has a height of 270 mm only, is usable for 1 mu m resolution, and is able to carry loading machines with a weight of up to 20 kg. This allows exposing samples to load between scans for image-guided failure assessment. This system has been used in the XTM end station of the materials science beamline of the Swiss Light Source at the Paul Scherrer Institut. (c) 2005 American Institute of Physics.