4.7 Article Proceedings Paper

Electrodeposition and characterization of transparent ZnO thin films

Journal

SOLAR ENERGY MATERIALS AND SOLAR CELLS
Volume 88, Issue 2, Pages 227-235

Publisher

ELSEVIER SCIENCE BV
DOI: 10.1016/j.solmat.2004.06.021

Keywords

zinc oxide; wurtzite structure; X-ray diffraction; optical properties; surface morphology

Ask authors/readers for more resources

Thin films of zinc oxide (ZnO) have been grown by potentiostatic cathodic deposition onto tin oxide-coated glass from a simple aqueous zinc nitrate electrolyte. Cyclic voltammetry (CV) experiments were performed to determine the reaction kinetics of the species. The various optimum deposition parameters like potential, pH and bath temperature are found to be -1.1 V (SCE), 5 +/- 0.1 and 80 degrees C, respectively. Structural characterization by X-ray diffraction indicates the formation of ZnO film with a preferred c-axis orientation and exhibits the wurtzite structure. Optical studies revealed a band gap energy 3.32 eV which is characteristic of ZnO films. SEM micrographs show a compact structure with nodular appearance, which is in agreement with the reported value of ZnO and the results are discussed. (c) 2004 Elsevier B.V. All rights reserved.

Authors

I am an author on this paper
Click your name to claim this paper and add it to your profile.

Reviews

Primary Rating

4.7
Not enough ratings

Secondary Ratings

Novelty
-
Significance
-
Scientific rigor
-
Rate this paper

Recommended

No Data Available
No Data Available