Journal
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT
Volume 547, Issue 1, Pages 24-41Publisher
ELSEVIER
DOI: 10.1016/j.nima.2005.05.009
Keywords
photoelectron spectroscopy; photoelectron diffraction; electronic structure; hard X-rays; synchrotron radiation
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The prospects for extending X-ray photoelectron spectroscopy (XPS) and X-ray photoelectron diffraction (XPD) measurements into the hard X-ray regime of 5-15 keV excitation energies are discussed from a fundamental point of view, in some cases using prior results obtained in the 1-2 keV range as starting points of discussion, together with theoretical estimates of behavior at higher energies. Subjects treated are: the instrumentation improvements needed to optimize peak intensities; the tuning of experimental conditions to achieve bulk or surface sensitivity; the use of grazing incidence to suppress spectral backgrounds; the use of standing waves created by Bragg reflection from crystal planes or synthetic multilayers to achieve position-sensitive densities of states, compositions, and magnetizations; photoelectron diffraction and Kikuchi-band effects as element-specific local structure probes; and valence-level measurements, including the role of non-dipole effects and mechanisms leading to complete Brillouin zone averaging and density-of-states like spectra. Several distinct advantages are found for such high-energy extensions of the XPS and XPD techniques. (c) 2005 Published by Elsevier B.V.
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