Anisotropic magnetoresistance and magnetic anisotropy in high-quality (Ga,Mn)As films

We have performed a systematic investigation of magnetotransport of a series of as-grown and annealed Ga1-xMnxAs samples with 0.011 <= x <= 0.09. We find that the anisotropic magnetoresistance (AMR) generally decreases with increasing magnetic anisotropy, with increasing Mn concentration and on low temperature annealing. We show that the uniaxial magnetic anisotropy can be clearly observed from AMR for the samples with x >= 0.02. This becomes the dominant anisotropy at elevated temperatures and is shown to rotate by 90 degrees on annealing. We find that the in-plane longitudinal resistivity depends not only on the relative angle between magnetization and current direction, but also on the relative angle between magnetization and the main crystalline axes. The latter term becomes much smaller after low temperature annealing. The planar Hall effect is in good agreement with the measured AMR, indicating the sample is approximately in a single domain state throughout most of the magnetization reversal, with a two-step magnetization jump ascribed to domain wall nucleation and propagation.