Journal
IEEE JOURNAL OF QUANTUM ELECTRONICS
Volume 41, Issue 8, Pages 1058-1064Publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/JQE.2005.851250
Keywords
linewidth enhancement factor (LEF); optical feedback; optimization algorithm; self-mixing interferometry; semiconductor lasers
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The paper presents a practical approach for measuring the linewidth enhancement factor a of semiconductor lasers and the optical feedback level factor C in a semiconductor laser with an external cavity. The proposed approach is based on the analysis of the signals observed in an optical feedback self-mixing interferometric system. The parameters ce and C are estimated using a gradient-based optimization algorithm that achieves best data-to-theoretical model match. The effectiveness and accuracy of the method has been confirmed and tested by computer simulations and experiments, which show that the proposed approach is able to estimate alpha and C with an accuracy of 6.7% and 4.63%, respectively.
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