Journal
SURFACE SCIENCE
Volume 587, Issue 3, Pages 175-184Publisher
ELSEVIER SCIENCE BV
DOI: 10.1016/j.susc.2005.05.013
Keywords
surface morphology; bismuth; graphite; growth; self-assembly; electron microscopy; atomic force microscopy
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We report on the growth of ultra-thin bismuth films on the basal plane of highly ordered pyrolitic graphite (HOPG) substrates. Scanning electron microscopy and atomic force microscopy have been used to characterize the morphology, and the crystallographic orientation was obtained using electron back scatter diffraction. Low coverage films are comprised of islands with a striped surface morphology, and show the orientation relationship {11 (2) over bar0}(Bi) parallel to {0001}(HOPG) with preferred in-plane orientations [11 (2) over bar0](Bi) parallel to[10 (1) over bar0](HOPG). With increasing film thickness, we identify an unusual orientation transformation to the commonly found Bi {0001} (trigonal) orientation. (c) 2005 Elsevier B.V. All rights reserved.
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