4.6 Article

PALS and SPM/EFM investigation of charged nanoporous electret films

Journal

CHEMICAL PHYSICS LETTERS
Volume 412, Issue 1-3, Pages 50-54

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ELSEVIER
DOI: 10.1016/j.cplett.2005.04.118

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The electret properties of nanoporous Teflon-FEP films, fabricated by the super-critical fluids method and charged by the corona method at room temperature, are investigated. PALS and SAXS are applied first to examine the charge characteristics of a free volume of electret materials. The topography and surface charges of electret materials are determined by scanning probe microscopy and electric field microscopy, respectively. The experimental results reveal that the interior surface areas of the pores of the electret materials influence the retention and stability of charge. Initial and aged surface charge was increased by factors of two and ten, with and without nanoporous Teflon-FEP films, respectively. (c) 2005 Elsevier B.V. All rights reserved.

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