Journal
JOURNAL OF APPLIED PHYSICS
Volume 98, Issue 5, Pages -Publisher
AMER INST PHYSICS
DOI: 10.1063/1.2034654
Keywords
-
Categories
Ask authors/readers for more resources
Dielectric measurements on polyimide-oxide nanoparticle composite thin films show a composite dielectric constant (epsilon(composite)) that increased monotonically with increasing oxide content well above the value predicted by Maxwell's rule for dielectric mixtures below the percolation threshold. Above certain volume fractions, the measured epsilon(composite) values were found to exceed the corresponding nanoparticle epsilon such that epsilon(polymer)
Authors
I am an author on this paper
Click your name to claim this paper and add it to your profile.
Reviews
Recommended
No Data Available